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UV LED measurements have always been a challenge due to the lower efficiency of the LEDs, lower signal intensities, longer integration times as well as temperature effects. This makes these measurements a very challenging task. This leads to significant measurement errors. With the DCP (Differential Continuous Pulse) measurement method an answer has been found to this challenge.
IES LM-92-22 DCP Method Requirements and Measurement Solution
For accurate measurements according to the DCP method (IES LM-92-22 and ongoing work in CIE TC2-91) two things are important:
A fast (µs range) spectroradiometer which is optimized for UV measurements
A fast SMU providing pulses in the µs range
If this is not given the measurement uncertainty raises since temperature effects or jitter produce larger errors.
Together with VektrexTM we set-up the DCP UV LED Test Station for accurate and fast measurements according to the DCP method. The current is swept automatically within the desired range and the full scan can be done within seconds to minutes. The system can be operated either via a Python script or via the S-BTS2048 application software.
The DCP UV LED Test Station does not only support the DCP method. Operating the LEDs via the short or long pulse method and even continuously is supported as well.
